InGaAs linear sensor reference circuit design - Section 1

John Gilmore, Lu Cheng, Hamamatsu Corporation
Scott Hunt, Analog Devices, Inc.
December 15, 2018

This technical note is divided into nine sections. To navigate to any section, use the hyperlinks above.

Section 1: Introduction

The objective of this tech note is to provide the reference circuit design for our most demanded InGaAs linear image sensor (LIS) series. This reference design can be used to drive the Hamamatsu one-stage TE-cooled InGaAs LIS G9201-256SB, G9202-512SB, G9203-256SA, G9204-512SA, G9211-256SB, G9212-512SB, G9213-256SA, G9214-512SA, and the two-stage TE-cooled InGaAs LIS with extended cutoff wavelength G9205-256/512WB, G9206-256/512WB, G9207-256WB, G9208-256/512WB. Please note: this reference circuit cannot drive the InGaAs LIS series including G14237-512WA, G11508-256/512SA, G11475-256/512WB, G11476-256WB, G11477-256/512WB, G11478-256/512WB, G11620-256/512SA, and G12230-512WB. For further information about the G11508/G1147x series please refer to https://www.hamamatsu.com/resources/pdf/ssd/g11508_etc_kmir1032e.pdf.

 

These InGaAs LIS series are designed for near infrared multi-channel spectrophotometry, non-destructive inspection, and DWDM wavelength monitor applications. These sensors consist of an InGaAs photodiode array, charge amplifiers, offset compensation circuit, and timing generator formed on a CMOS chip. The spectral response characteristics of these series that the reference circuit can support is as follows:

Figure 1-1: Spectral response

In this tech note a system design including the analog front-end sensor board, the FPGA modules, the USB processor, and the data acquisition software is described. And the test results of the I/O signals, noise, and linearity are presented for various pixel formats and timing control modes.