MPPC SiPMs

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A technical guide to silicon photomultipliers (MPPC)

This extensive guide to MPPCs describes the device's operating principle, its performance parameters, and how to measure various characteristics such as gain, breakdown voltage, photon detection efficiency, and linearity.

What is an SiPM and how does it work?

This technical guide gives an operational overview of SiPMs. It also covers SiPM photon detection efficiency, breakdown voltage measurement, signal-to-noise in a continuous wave operation, optical crosstalk, and crosstalk probability measurement.

How does temperature affect the performance of an SiPM?

This technical note summarizes the present understanding of how changes in temperature affect the key opto-electronic characteristics of an SiPM. It relies on published results in peer-reviewed articles and is organized into semi-autonomous sections, each discussing a particular characteristic such as breakdown voltage, photon detection efficiency, signal shape, and dark count rate.

Silicon photomultipliers (SiPM): The ultimate photosensor?

Today, many types of photosensors are capable of detecting the arrival of a single photon. But silicon photomultipliers (SiPM) are the only possibility when image sensing with single-photon resolution, exact time-of-arrival determination, a high dynamic range, low power consumption, and digital output in a single-chip solution are required.

What are the effects of temperature on dark count rates in an SiPM (MPPC)?

In any solid state detector, an increase in dark counts will adversely affect signal-to-noise ratio. This technical note describes the sources of dark counts in a silicon photomultiplier (SiPM), and provides examples of how dark counts vary under different operating conditions.

How does temperature affect the gain of an SiPM?

Many applications require the stability of a photodetector's gain with respect to temperature changes. This technical note discusses the origin of the gain-temperature dependence in a SiPM and methods to correct for it.

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